Artificial intelligence is one of the driving forces in today’s semiconductor industry, with more traditional market drivers like high performance compute and smart phones continuing to play important ...

Semiconductor devices are becoming thinner and more complex, making thin deposited films even harder to measure and control. With 3nm node devices in production and 2nm nodes ramping toward ...

Ellipsometry Porosimetry (EP) is used to measure the thickness of the materials and how its optical properties change throughout adsorption and desorption of a volatile species either under less ...

Optical microscopy has long served as a fundamental tool in the visualisation of intricate structures across biological, materials and industrial research. Recent advancements in metrology techniques ...

Researchers typically use Raman spectroscopy to check the structural quality and thickness of graphene, but because the technique can only cover a small area in a given time, it’s painfully slow. It ...

Biologically active films are crucial in the field of medical devices and sensors, where precision, reliability, and compatibility are essential. Films are usually comprised of biomaterials or ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The Accurion EP4, the latest imaging ...

(Nanowerk News) Two-dimensional (2D) material flakes consist of single to few atomic layers, granting them extraordinary quantum properties, which are not observed in everyday materials. As a result, ...

(Nanowerk News) Scientists from Skoltech and their colleagues from Russia and Finland have figured out a non-invasive way to measure the thickness of single-walled carbon nanotube films, which may ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure Accurion EP4, the latest imaging ...

Scientists from Skoltech and their colleagues from Russia and Finland have figured out a non-invasive way to measure the thickness of single-walled carbon nanotube films, which may find applications ...