Fujifilm and HORIBA Co-develop High-Sensitivity Inline Raman Measurement System for Real-Time Monitoring of Cell Culture and Purification in Biopharmaceutical Man…

Improves Antibody Yield by About 10% in the Purification ProcessJune 16, 2026 -- FUJIFILM Corporation (President and CEO, ...
EDN

KLA-Tencor Announces Novel Defect Discovery and Monitoring Technology

“Our customers are highly motivated to continue to extend optical inline defect inspection beyond the 20nm node,” said Keith Wells, vice president and general manager of the Wafer Inspection (WIN) ...
Semiconductor Engineering

Modulated Electron Microscopy Applied In The Process Monitoring Of Memory Cell And The Defect Inspection Of Floating Circuits

A technical paper titled “In situ electrical property quantification of memory devices by modulated electron microscopy” was published by researchers at Hitachi High-Tech Corporation, KIOXIA ...
Nature

Design of multi-mode intelligent system architecture for surface defect detection of steel based on cloud technology

This research establishes an advanced cloud-native multimodal intelligent system architecture dedicated to automated detection and real-time monitoring of steel surface defects. The architecture ...
Semiconductor Engineering

How Guardbanding Of Inline Wafer Defects Can Improve Chip Reliability Insurance

Partially defective, marginal die can still be functional enough to pass final electrical test. Some of these “walking wounded” chips get past final testing, but in the customer’s end product, under ...